Analysis Equipment
Analysis Equipment
We use state-of-the-art analysis equipment to manage plating processes, conduct surface analysis, and evaluate materials and plating samples. This enables us to maintain stable quality for both prototypes and mass production while developing solutions.
For Analyzing Surfaces
- X-Ray Diffractometer
- Digital Optical Microscope
- Scanning electron microscope(SEM)
- Field emission scanning electron microscope(FE-SEM)
- Energy dispersive X-ray analyzer(EDS)
- Surface roughness measuring instrument(Laser type)
- Colar laser microscope
- Atomic force microscope(AFM)
- Absorption spectrophotometer(for solid measurement)
- Ar Ion beam Cross section polisher(CP)
- X-ray Photoelectron Spectroscopy(XPS ESCA)
- X-ray diffractometer(XRD)
- Differential scanning calorimetry(DSC)
- Impedance measurement device
For analyzing solutions
- Atomic Absorption Spectrometry (AAS)
- Inductivity Coupled Plasma Optical Emission Spectrometer(ICP-OES)
- Ion Chromatograph (IC)
- High-performance Capillary Electrophoresis System (HPCE)
- UV-Vis spectrophotometer (UV-Vis)
- Polarograph
- Cyclic voltammetry stripping (CVS)
- Automatic titrator
- Surfactant titrator
- Surface tensiometer
- pH / electrical conductometer
Test evaluation
- Tensile strength tester
- Micro indentation hardness tester
- Accelerated life testing machine
- Image dimension measuring machine
- Measuring microscope
